The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Dec. 24, 2020
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Haoyu Ren, San Diego, CA (US);

Amin Kheradmand, Mountain View, CA (US);

Mostafa El-Khamy, San Diego, CA (US);

Shuangquan Wang, San Diego, CA (US);

Dongwoon Bai, San Diego, CA (US);

Jungwon Lee, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06N 3/088 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06T 3/4046 (2013.01); G06N 3/045 (2023.01); G06N 3/088 (2013.01); G06T 3/4053 (2013.01);
Abstract

A method and apparatus are provided. The method includes generating a dataset for real-world super resolution (SR), training a first generative adversarial network (GAN), training a second GAN, and fusing an output of the first GAN and an output of the second GAN.


Find Patent Forward Citations

Ren, Haoyu. (2023). Systems and method of training networks for real-world super resolution with unknown degradations (U.S. Patent No. 11790489). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11790489

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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