The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Mar. 20, 2020
Applicant:

Evident Scientific, Inc., Waltham, MA (US);

Inventors:

Vijay Chilakapati, Hollis, NH (US);

Gregory Bauer, W. Newton, MA (US);

Vishal Dharmadhikari, Waltham, PA (US);

Assignee:

Evident Scientific, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/04 (2012.01); G06Q 10/10 (2023.01); G06N 20/00 (2019.01); G06T 11/20 (2006.01); G06N 5/04 (2023.01); G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
G06Q 50/04 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06Q 10/10 (2013.01); G06T 11/206 (2013.01); G01B 17/02 (2013.01); G06T 2200/24 (2013.01);
Abstract

A system comprises a server including a port, memory and processing circuitry. The port is configured to receive (i) a drawing file associated with an isometric drawing of an asset at an inspection site including indications of condition monitoring locations (CMLs) for the asset, and (ii) inspection measurement data for the asset, the inspection measurement data including inspection measurements associated with the CMLs. The memory is configured to store the drawing file and the inspection measurement data. The processing circuitry is configured to use the inspection data and the drawing file to generate, using the inspection measurement data and the drawing file, (i) survey image data for display and (ii) metadata for the survey image data, the metadata including survey image coordinates for the CMLs and the inspection measurements associated with the CMLs.


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