The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jul. 31, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kuntal Dey, New Delhi, IN;

Sameep Mehta, New Delhi, IN;

Manish Anand Bhide, Hyderabad, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06N 3/08 (2023.01); G06N 5/02 (2023.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06N 3/08 (2013.01); G06N 5/02 (2013.01); G06N 3/02 (2013.01);
Abstract

Aspects of the present invention provide an approach for reducing bias in active learning. In an embodiment, a data point is selected from a training dataset for a current training iteration while monitoring for data bias at each addition of data to a virtual training dataset. In addition, a machine learning model is examined for bias after adding the selected data point to the virtual training dataset. When data bias and/or model bias is detected, the data point is considered for potential label modification. The selected data point is modified and, if the raw value of the modified data point is within a predefined tolerance and within a bin of a desired class, the modified data point having a label of the target class is retained. Otherwise, it can be discarded.


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