The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jan. 10, 2020
Chevron U.s.a. Inc., San Ramon, CA (US);
California Institute of Technology, Pasadena, CA (US);
Asitang Mishra, Los Angeles, CA (US);
Shuxing Cheng, Houston, TX (US);
Annie Didier, Pasadena, CA (US);
Chris Mattmann, Pasadena, CA (US);
Hamsa Shwetha Venkataram, Pasadena, CA (US);
Grant Lee, Houston, TX (US);
Wayne Moses Burke, Ann Arbor, MI (US);
Vishal Lall, Los Angeles, CA (US);
CHEVRON U.S.A. INC., San Ramon, CA (US);
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Abstract
A computer-implemented, machine learning-based method of converting an unstructured technical report into a structured technical report includes obtaining an unstructured technical report, tokenizing the unstructured technical report into an n-gram array, identifying and filtering non-interesting n-grams from the first n-gram array based on common language usage of the non-interesting n-grams and a determination that the non-interesting n-grams do not appear on a confirmed technical entity database, generating and displaying a technical entity candidate list from the filtered n-gram array, displaying, obtaining, from a pattern matching model and/or a graphical user interface, an indication that a technical entity candidate is a technical entity of interest, appending the technical entity of interest to the confirmed technical entity database, generating and displaying a structured technical report with the confirmed technical entities and corresponding technical entity value parameters, and iterating the process to refine the pattern matching model.