The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Apr. 14, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jaione Tirapu Azpiroz, Rio de Janeiro, BR;

Christian Srebrenov Rashev, Brno - Stránice, CZ;

William Bruce Nicol, II, Durham, NC (US);

Emily Supil, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/34 (2013.01); G06F 21/40 (2013.01); G07C 9/32 (2020.01);
U.S. Cl.
CPC ...
G06F 21/34 (2013.01); G06F 21/40 (2013.01); G07C 9/32 (2020.01);
Abstract

An approach is provided to authenticate objects based on surface patterns on the object. In the approach, a pressure pattern is measured between a sensor array surface of a pressure mapping sensor array accessible by the processor and one of the object's surfaces. A set of characteristics of the object surface is extracted based on the pressure pattern resulting from the measuring. These characteristics are compared to a set of expected characteristics with the object being authenticated based on the comparison.


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