The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Nov. 10, 2017
Applicant:

Oxford University Innovation Limited, Oxford, GB;

Inventor:

Manus Patrick Henry, Oxford, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2022.01); G06F 17/14 (2006.01); H03H 17/02 (2006.01); G01F 1/84 (2006.01);
U.S. Cl.
CPC ...
G06F 17/141 (2013.01); G01F 1/66 (2013.01); G01F 1/8431 (2013.01); G01F 1/8436 (2013.01); H03H 17/0201 (2013.01);
Abstract

A system for tracking selected wave parameters from a received sinusoidal wave with noise and methods for making and using the same. The method includes performing a multi-track double integral analysis of the sinusoidal wave with noise and creating time dependent outputs. These time dependent outputs may be analyzed mathematically to determine the amplitude, frequency and/or phase of the wave with reduced noise. In one embodiment, the method may employ multiple passes through double integral analysis. The method advantageously can measure output sinusoidal wave parameters with reduced noise, measurements that are close to theoretical noise reduction limits.


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