The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Sep. 20, 2022
Applicant:

Palantir Technologies Inc., Denver, CO (US);

Inventors:

Allen Chang, Mountain View, CA (US);

Denis Rochau, London, GB;

Eric Raboin, Portland, OR (US);

Joel Ossher, Oakton, VA (US);

Sam Stoll, London, GB;

Assignee:

Palantir Technologies Inc., Denver, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/14 (2019.01); G06F 16/174 (2019.01);
U.S. Cl.
CPC ...
G06F 16/152 (2019.01); G06F 16/174 (2019.01);
Abstract

Systems and methods are provided for determining multiple fragments of data to be imported, the multiple fragments of data corresponding to different instances of data obtained from one or more external data sources, the different instances of data each corresponding to duplicate content. The multiple fragments of data that each correspond to different instances of duplicate content can be ingested. The multiple fragments of data can be de-duplicated to determine one or more corresponding object data source records (DSRs). The one or more object DSRs can be imported within a data platform system.


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