The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jul. 01, 2020
Cornerstone Research Group, Inc., Miamisburg, OH (US);
Mark Cridge, Miamisburg, OH (US);
Trang T. Young, Dayton, OH (US);
Matthew Benefiel, Xenia, OH (US);
Mitchell Bauer, Beavercreek, OH (US);
Gianfranco Trovato, Monroe, OH (US);
Kristin M. Cable, Dayton, OH (US);
Cornerstone Research Group, Inc., Miamisburg, OH (US);
Abstract
A method of detecting an event and recording quantitative parameters associated with the event is provided. The method includes securing an event detection and recording system on a piece of equipment, the event detection and recording system comprising a plurality of sensors, an internal power source, and a microcontroller. The method further includes activating a low monitoring mode and measuring one or more quantitative parameters with the one or more of the sensors at a first sampling rate to generate low monitoring mode sensor data; analyzing the low monitoring mode sensor data to detect initiation of a triggering event; terminating the low monitoring mode upon detection of the triggering event; and activating a high monitoring mode including measuring and recording one or more quantitative parameters at a second sampling rate, where the second sampling rate is greater than the first sampling rate. The associated system is also provided.