The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Dec. 31, 2019
Applicant:

Visa International Service Association, San Francisco, CA (US);

Inventors:

Yuexi Chen, Foster City, CA (US);

Kiat Chun Tan, Singapore, SG;

Mochammed Iqbal Pakeh, Kecamatan batam Kota, ID;

Baoxiang Kang, Singapore, SG;

Arlene Yap Bernas, Singapore, SG;

Si Xiang Lim, Singapore, SG;

Assignee:

Visa International Service Association, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06F 11/22 (2006.01); G06F 11/273 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/2221 (2013.01); G06F 11/2273 (2013.01); G06F 11/2733 (2013.01);
Abstract

A method for testing an interaction system response to different types of interaction devices is disclosed. A testing computer can execute various sets of interaction device logic during different test interaction. The testing computer can electronically communicate with an access device during test interaction through a conduit mobile device. As a result, the testing computer can electronically communicate with the access device even when the testing computer is remotely located.


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