The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jan. 31, 2022
Splunk Inc., San Francisco, CA (US);
Gergely Danyi, Cupertino, CA (US);
Sakshi Garg, San Francisco, CA (US);
Maxime Petazzoni, San Mateo, CA (US);
Sahinaz Safari Sanjani, San Mateo, CA (US);
Timothy Matthew Robin Williamson, Santa Barbara, CA (US);
Eric Wohlstadter, Atherton, CA (US);
SPLUNK Inc., San Francisco, CA (US);
Abstract
A method of identifying a root cause of a failure for a trace within a microservices-based application includes determining if a root span of the trace is an error span resulting in an error experienced by a user at a front end of the microservices-based application. If the root span of the trace is an error span, the method analyzes a plurality of spans comprising the trace to determine if the trace comprises at least one leaf error span. If the trace comprises a single leaf error span, the method attributes the root cause of the failure in the trace to a service associated with the single leaf error span. If the trace comprises multiple leaf error spans the method attributes the root cause of the failure in the trace to a service associated with a leaf error span of the multiple leaf error spans comprising a latest starting timestamp.