The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Oct. 09, 2020
Applicant:

Pratt & Whitney Canada Corp., Longueuil, CA;

Inventor:

Rachid Guiassa, Saint-Léonard, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/401 (2006.01); B23Q 17/20 (2006.01); G01B 21/04 (2006.01); G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4015 (2013.01); B23Q 17/20 (2013.01); G01B 21/042 (2013.01); B23Q 2717/006 (2013.01); G01B 5/012 (2013.01); G05B 2219/50031 (2013.01); G05B 2219/50252 (2013.01);
Abstract

There is described a system for manufacturing a part. The system generally has a receiving area receiving said part, a first reference gauge and a second reference gauge which are subjected to common environmental conditions, said first reference gauge having a first nominal dimension and said second reference gauge having a second nominal dimension different from said first nominal dimension; a measurement device measuring dimensions of said first and second reference gauges, and measuring dimensions of said part; and a controller communicatively coupled to said measurement device, said controller determining a calibration curve by performing a mathematical fit based on said first and second nominal dimensions and said measured dimensions of said first and second reference gauges; and constructing a machine-readable dataset representative of said part, including modifying said measured dimensions of said part based on said calibration curve.


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