The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jul. 16, 2021
Siemens Healthcare Gmbh, Erlangen, DE;
Stefan Popescu, Erlangen, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A measurement device for measuring MR signals in a MR device may include first and second magnetometers and a controller. The first magnetometer may be a quantum spin magnetometer that includes a sensor material having a spin defect center including Zeeman splitting states dependent on an external magnetic field of the MR device, an optical excitation source and a microwave excitation source for electromagnetically exciting the sensor material, and a measurement sensor for measuring optical signals emitted by the excited sensor material element and depending on the Zeeman splitting states. The controller may be configured to determine a working frequency of the microwave excitation source of the first magnetometer from the total magnetic field strength measured by the second magnetometer, and control the microwave excitation source to use the determined working frequency as microwave frequency, such that the first magnetometer measures the MR signals as the optical signal.