The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Mar. 24, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Michael Feilen, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31926 (2013.01); G01R 31/31935 (2013.01);
Abstract

A measurement system is described. The measurement system includes a test-and-measurement (T&A) circuit and an error analysis circuit. The T&A circuit is configured to generate measurement data. The measurement data includes at least one of analysis data and configuration data. The analysis data is associated with an analysis of at least one input signal. The configuration data is associated with at least one of a physical measurement setup of the measurement system and measurement settings of the measurement system. The T&A circuit further is configured to generate a graphic representation of the measurement data. The error analysis circuit is configured to identify errors or anomalies associated with the measurement data based on the graphic representation. Further, a measurement method is described.


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