The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Oct. 13, 2021
National Instruments Corporation, Austin, TX (US);
James C. Nagle, Leander, TX (US);
Stephen Thung, Norman, OK (US);
Sergey Kizunov, Sunny Isles Beach, FL (US);
Shaul Teplinsky, Orinda, CA (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.