The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Feb. 08, 2021
Marvell Israel (M.i.s.l) Ltd., Yokneam, IL;
Liav Ben Artsi, Nahariya, IL;
Marvell Israel (M.I.S.L) Ltd., Yokneam, IL;
Abstract
An integrated circuit (IC) is manufactured and is mounted in an IC package. A processor of a measurement system determines a reference value of a physical layer (PHY) parameter at a second test point on a test fixture based on one or more model values, specified by an Ethernet communication standard, corresponding to a first test point on the test fixture corresponding to a contact on the IC package and one or more measured test fixture parameters characterizing a channel connecting the first test point to the second test point on the test fixture. The processor then determines whether the PHY parameter at the first test point on the IC package complies with the Ethernet communication standard based on i) the reference value of the PHY parameter and ii) a measured value of the PHY parameter obtained from a measurement of the PHY parameter at the second test point.