The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Dec. 27, 2022
Applicants:

Zhejiang Lab, Zhejiang, CN;

Zhejiang University, Zhejiang, CN;

Inventors:

Huizhu Hu, Zhejiang, CN;

Zhenhai Fu, Zhejiang, CN;

Xiaowen Gao, Zhejiang, CN;

Tao Liang, Zhejiang, CN;

Peitong He, Zhejiang, CN;

Jing Jiang, Zhejiang, CN;

Assignees:

Zhejiang Lab, Zhejiang, CN;

Zhejiang University, Zhejiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
G01R 29/12 (2013.01);
Abstract

A method for electric field measurement based on a levitated particle includes steps of (1) capturing a particle and levitating the captured particle; (2) adjusting a quantity of electric charge carried by the levitated particle; (3) measuring a charge number N of the levitated particle; (4) disposing the levitated particle in an electric field to be measured, measuring a displacement power spectral density Sof the levitated particle under the electric field and obtaining an electric field force F; and (5) according to a formula of E=F/Nq, obtaining an electric field intensity E. An apparatus for electric field measurement based on a levitated particle includes a high-voltage DC (direct current) power supply, two bare wire electrodes, a vacuum chamber, a trapping laser, an objective lens, a pair of parallel electrodes, a collective lens, a quadrant photodetector, a lock-in amplifier, a signal generator and a power amplifier.


Find Patent Forward Citations

Hu, Huizhu. (2023). Method and apparatus for electric field measurement based on a levitated particle (U.S. Patent No. 11789057). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11789057

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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