The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Mar. 22, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Johannes Steffens, Rosenheim, DE;

Hermann Boss, Holzkirchen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H04N 23/54 (2023.01); H04N 23/56 (2023.01); H04N 23/69 (2023.01); H04N 23/667 (2023.01); H04N 23/68 (2023.01); H04N 23/698 (2023.01); H04N 13/239 (2018.01); H04N 23/50 (2023.01);
U.S. Cl.
CPC ...
G01R 1/06794 (2013.01); H04N 23/54 (2023.01); H04N 23/56 (2023.01); H04N 23/667 (2023.01); H04N 23/683 (2023.01); H04N 23/687 (2023.01); H04N 23/69 (2023.01); H04N 23/698 (2023.01); H04N 13/239 (2018.05); H04N 23/555 (2023.01);
Abstract

The present invention relates to an improved probe for precisely positioning a probe tip at a measurement point. For this purpose, an image capturing device such as a camera may be firmly arranged at the probe. The image capturing device may capture image data around an area of the probe tip. The captured image data may be provided to a user during positioning the probe tip at the desired measuring point.


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