The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Nov. 18, 2021
Applicant:

Endress+hauser Group Services Ag, Reinach, CH;

Inventors:

Alexey Malinovskiy, Maulburg, DE;

Markus Nick, Kembs, FR;

Francois Klein, Hagenthul de Haut, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

A monitoring method includes monitoring variables that change over time and are continuously measured during repeated executions of a dynamic process. The measurement data include training data in a training period and monitoring data measured subsequently to the training period. Vectors are continuously determined based on the measurement data, the vector components of which comprise respective rates of change of the measured values of the individual measured variables determined for a series of successive points in time on the basis of the measurement data, wherein the points in time of each series cover a time window of a duration and the time windows of successive vectors are shifted. The vectors are stored as a reference cluster. The vectors are compared with the reference cluster. An anomaly is determined when a vector is outside the reference cluster.


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