The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Sep. 29, 2022
Applicant:
Aeva, Inc., Mountain View, CA (US);
Inventors:
Brett E. Huff, Keller, TX (US);
Pradeep Srinivasan, Fremont, CA (US);
Assignee:
Aeva, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01); G01M 11/30 (2013.01); G01R 31/31728 (2013.01); G01R 31/318511 (2013.01); G02B 6/12004 (2013.01);
Abstract
A method of testing a photonics die at the wafer level includes providing a sacrificial waveguide and a grating coupler at least partially in a scribe line between dies of a wafer, performing one or more tests on the dies of the wafer via the sacrificial waveguide and grating coupler in the scribe line, and removing the sacrificial waveguide during separation of the dies of the wafer.