The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Aug. 13, 2021
Applicant:

Yokogawa Electric Corporation, Musashino, JP;

Inventor:

Osamu Furukawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 3/08 (2006.01); G06N 20/00 (2019.01); G01K 3/00 (2006.01);
U.S. Cl.
CPC ...
G01K 3/08 (2013.01); G01K 3/005 (2013.01); G06N 20/00 (2019.01); G01K 2219/00 (2013.01);
Abstract

An abnormal temperature detection device includes a temperature acquirer configured to acquire temperature data, a preprocessor configured to perform preprocessing for calculating difference data indicating a difference sequence in the temperature data, generating substituted data in which either of a piece of difference data which is a positive number or a piece of difference data which is a negative number is substituted with zero, and calculating a similarity between the substituted data and reference data obtained from training data in which normality or abnormality has been identified, a learner configured to perform machine learning on the similarity calculated by the preprocessor and output an identification function, and a determiner configured to determine whether temperature data for detection acquired by the temperature acquirer and subjected to the preprocessing by the preprocessor is normal or abnormal by using the identification function.


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