The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jun. 09, 2022
The United States of America, As Represented BY the Secretary of Agriculture, Washington, DC (US);
Moon S. Kim, Ashton, MD (US);
Diane E. Chan, Odenton, MD (US);
Jianwei Qin, Ellicott City, MD (US);
Insuck Baek, Burtonsville, MD (US);
The United States of America, as represented by the Secretary of Agriculture, Washington, DC (US);
Abstract
A line scan imaging system scans a targeted inspection area and gathers reflectance and fluorescence data. The inspection system comprises at least a rotatable/pivotable mirror-faced triangular prism, a line illumination source, and a line scan hyperspectral camera. The prism has a mirrored camera face and a mirrored illumination face. In operation, as the prism rotates, the camera instantaneous field of view (IFOV) and the projected illumination line converge at a nadir convergence scan line so that the hyperspectral camera receives line scan data from the nadir convergence scan line as the nadir convergence scan line traverses an inspection area.