The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Jan. 29, 2021
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Zihao Yang, Santa Clara, CA (US);

Mingwei Zhu, San Jose, CA (US);

Nag B. Patibandla, Pleasanton, CA (US);

Nir Yahav, Sunnyvale, CA (US);

Robert Jan Visser, Menlo Park, CA (US);

Adi de la Zerda, Los Altos, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); H10N 60/85 (2023.01); H10N 60/01 (2023.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0437 (2013.01); H10N 60/0801 (2023.02); H10N 60/85 (2023.02); G01J 2001/0496 (2013.01); G01J 2001/442 (2013.01);
Abstract

A superconducting nanowire single photon detector (SNSPD) device includes a substrate, a distributed Bragg reflector on the substrate, a seed layer of a metal nitride on the distributed Bragg reflector, and a superconductive wire on the seed layer. The distributed Bragg reflector includes a plurality of bi-layers, each bi-layer including lower layer of a first material and an upper layer of a second material having a higher index of refraction than the first material. The wire is a metal nitride different from the metal nitride of the seed material.


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