The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
May. 15, 2019
Applicant:
Samsung Display Co., Ltd., Yongin-Si, KR;
Inventor:
Seonghyeon Cheon, Gwacheon-si, KR;
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 17/02 (2006.01); F25D 19/00 (2006.01); G01N 29/07 (2006.01); G01N 29/32 (2006.01);
U.S. Cl.
CPC ...
G01B 17/025 (2013.01); F25D 19/00 (2013.01); G01B 17/02 (2013.01); G01N 29/07 (2013.01); G01N 29/32 (2013.01); G01N 29/326 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/048 (2013.01); G01N 2291/101 (2013.01); G01N 2291/102 (2013.01);
Abstract
An apparatus for measuring thickness includes: a chamber; a sound wave transmitter transmitting a sound wave in the chamber; a sound wave receiver receiving the sound wave transmitted from the sound wave transmitter in the chamber; and a supporter between the sound wave transmitter and the sound wave receiver.
Quick Actions:
Cheon, Seonghyeon. (2023). Apparatus for measuring sample thickness and method for measuring sample thickness (U.S. Patent No. 11788835). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11788835
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile