The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Mar. 30, 2021
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventors:

Yoshihiro Hori, Nisshin, JP;

Takayoshi Doi, Toyota, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/14 (2006.01); F17C 13/02 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
F17C 13/025 (2013.01); G01N 29/14 (2013.01); G01N 29/4454 (2013.01); F17C 2201/0109 (2013.01); F17C 2203/0604 (2013.01); F17C 2203/0619 (2013.01); F17C 2203/0673 (2013.01); F17C 2221/012 (2013.01); F17C 2223/035 (2013.01); F17C 2250/043 (2013.01); F17C 2250/0694 (2013.01); G01N 2291/2695 (2013.01);
Abstract

A pressure testing method capable of determining with a higher accuracy whether a high-pressure tank is deteriorated. The pressure testing method tests the high-pressure tank that includes a liner and a fiber-reinforced resin layer covering the outer surface of the liner and that has been used while repeating charge and discharge of gas to and from the inside thereof after undergoing a pressure resistance test conducted at a pressure resistance test pressure. The method increases the internal pressure of the high-pressure tank filled with gas to a test pressure that is lower than the pressure resistance test pressure, so that a plurality of AE waveforms is extracted from output waveforms of an AE sensor that detects AE waves generated in the high-pressure tank, and determines whether the high-pressure tank is deteriorated, on the basis of the extracted AE waveforms.


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