The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Oct. 17, 2022
Applicant:

Government of the United States, As Represented BY the Secretary of the Air Force, Wright-Patterson AFB, OH (US);

Inventor:

Vladimir Tassev, Beavercreek, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/04 (2006.01); H01L 21/02 (2006.01); C30B 29/44 (2006.01); C30B 29/40 (2006.01); C30B 25/18 (2006.01); G02F 1/355 (2006.01); C30B 29/42 (2006.01); C30B 29/48 (2006.01); C30B 25/02 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
C30B 25/04 (2013.01); C30B 25/02 (2013.01); C30B 25/18 (2013.01); C30B 29/403 (2013.01); C30B 29/406 (2013.01); C30B 29/42 (2013.01); C30B 29/44 (2013.01); C30B 29/48 (2013.01); G02F 1/3556 (2013.01); H01L 21/024 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02293 (2013.01); H01L 21/02387 (2013.01); H01L 21/02389 (2013.01); H01L 21/02392 (2013.01); H01L 21/02395 (2013.01); H01L 21/02398 (2013.01); H01L 21/02458 (2013.01); H01L 21/02461 (2013.01); H01L 21/02463 (2013.01); H01L 21/02466 (2013.01); H01L 21/02505 (2013.01); H01L 21/02538 (2013.01); H01L 21/02543 (2013.01); H01L 21/02546 (2013.01); H01L 21/02549 (2013.01); H01L 21/02551 (2013.01); H01L 21/02568 (2013.01); H01L 21/02658 (2013.01); H01L 31/1828 (2013.01); G02F 1/3558 (2013.01);
Abstract

A method of performing HVPE heteroepitaxy comprises exposing a substrate to a carrier gas, a first precursor gas, a Group II/III element, and ternary-forming gasses (V/VI group precursor), to form a heteroepitaxial growth of a binary, ternary, and/or quaternary compound on the substrate; wherein the carrier gas is Hz, wherein the first precursor gas is HCl, the Group II/III element comprises at least one of Zn, Cd, Hg, Al, Ga, and In; and wherein the ternary-forming gasses comprise at least two or more of AsH(arsine), PH(phosphine), HSe (hydrogen selenide), HzTe (hydrogen telluride), SbH(hydrogen antimonide, or antimony tri-hydride, or stibine), HS (hydrogen sulfide), NH(ammonia), and HF (hydrogen fluoride); flowing the carrier gas over the Group II/III element; exposing the substrate to the ternary-forming gasses in a predetermined ratio of first ternary-forming gas to second ternary-forming gas (1tf:2tf ratio); and changing the 1tf:2tf ratio over time.


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