The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2023

Filed:

Mar. 17, 2023
Applicant:

Inivata Ltd., Cambridge, GB;

Inventors:

Vincent Plagnol, Cambridge, GB;

Tim Forshew, Stevenage, GB;

Samuel Woodhouse, Cambridge, GB;

Andrew Lawson, Waltham Cross, GB;

Matthew Smith, Cambridge, GB;

Assignee:

INIVATA LTD., Cambridge, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/6806 (2018.01); G16B 50/00 (2019.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6806 (2013.01); G06F 17/18 (2013.01); G16B 50/00 (2019.02); C12Q 2600/158 (2013.01); C12Q 2600/16 (2013.01);
Abstract

A method for the analysis of minimal residual disease is provided. In some embodiments, the method comprises obtaining multiple pairs of primers designed to amplify sequences that contain a plurality of sequence variations that have been previously identified in a patient's tumor. Amplicons are then obtained through a targeted multiplex amplification that amplifies those sequences from cell-free DNA isolated from a plasma sample. The amplicons are sequenced and two or more of the sequence variations are detected from sequence reads, wherein the detecting comprises comparing a quantity of sequence reads containing a sequence variation against a threshold value. A score is then calculated for the patient sample based on the combined allele frequencies of the detected two or more sequence variations, wherein the score indicates the presence of minimal residual disease.


Find Patent Forward Citations

Loading…