The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2023
Filed:
Jan. 15, 2020
Siemens Healthcare Gmbh, Erlangen, DE;
Annette Birkhold, Nuremberg, DE;
Markus Kowarschik, Nuremberg, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method is for determining a three-dimensional image dataset. In an embodiment, the method includes a first X-ray dataset of the examination volume being received, the first X-ray dataset including a two-dimensional first X-ray projection of the examination volume with respect to a first projection direction; and a second X-ray dataset of the examination volume being received, the second X-ray dataset including a second two-dimensional X-ray projection of the examination volume with respect to a second projection direction. Furthermore, a first three-dimensional image dataset of the examination volume is determined based on the two-dimensional first X-ray projection and the two-dimensional second X-ray projection. An effect of overlaps of vessels with respect to the first projection direction or the second projection direction can be reduced as a result of determining the first three-dimensional image dataset based on the first X-ray dataset and the second X-ray dataset.