The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Apr. 29, 2021
Qualcomm Incorporated, San Diego, CA (US);
Ting Kong, San Diego, CA (US);
Yongle Wu, San Diego, CA (US);
Yong Li, San Diego, CA (US);
Jun Zhu, San Diego, CA (US);
Raghu Narayan Challa, San Diego, CA (US);
Linzhe Li, San Diego, CA (US);
Aparna Narayanan, Redwood City, CA (US);
Uzma Khan Qazi, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A UE is configured to determine a set of parameters associated with receiving the SSBs, the set of parameters including a first parameter bitmap associated with a serving cell, a second parameter bitmap associated with the neighbor cell, and the SMTC. The UE is configured to determine a search window for searching the received SSBs based on the SMTC and at least one of the first parameter bitmap or the second parameter bitmap. The UE may measure the SSBs searched during the determined search window and send measurement results associated with at least a subset of the measured SSBs to the base station. The UE may also prune measurements to generate the measurement results by removing measurements associated with SSBs received in slots that are not indicated to expect SSBs, based on the first parameter bitmap, the second first parameter bitmap, or the SMTC.