The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Feb. 25, 2022
Applicant:
Zscaler, Inc., San Jose, CA (US);
Inventor:
Sandeep Kamath, San Jose, CA (US);
Assignee:
Zscaler, Inc., San Jose, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/10 (2022.01); H04L 43/18 (2022.01); H04L 45/74 (2022.01); H04L 12/46 (2006.01); H04L 43/0823 (2022.01); H04L 45/24 (2022.01); H04L 41/0816 (2022.01); H04L 67/148 (2022.01); H04L 67/5682 (2022.01); H04L 101/663 (2022.01);
U.S. Cl.
CPC ...
H04L 43/10 (2013.01); H04L 12/4633 (2013.01); H04L 41/0816 (2013.01); H04L 43/0847 (2013.01); H04L 43/18 (2013.01); H04L 45/24 (2013.01); H04L 45/742 (2013.01); H04L 67/148 (2013.01); H04L 67/5682 (2022.05); H04L 2101/663 (2022.05);
Abstract
Techniques for using trace with tunnels and cloud-based systems for determining measures of network performance are presented. Systems and methods include determining a number of hops from a source that is the user device and a destination, including determining metrics from the source to the destination; performing a trace to all intermediate nodes between the source and the destination, including determining metrics from the source to each of the intermediate nodes; and combining and presenting the metrics from the source to the destination and from the source to each of the intermediate nodes.