The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Mar. 05, 2021
Applicant:

Dalian University of Technology, Liaoning, CN;

Inventors:

Qi Jia, Liaoning, CN;

Xin Fan, Liaoning, CN;

Zhongxuan Luo, Liaoning, CN;

Yu Liu, Liaoning, CN;

Qian Wang, Liaoning, CN;

Risheng Liu, Liaoning, CN;

Yi Wang, Liaoning, CN;

Xiujuan Xu, Liaoning, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 7/13 (2017.01);
Abstract

The present invention relates to the technical field of digital image processing, and provides an ellipse detection acceleration method based on generalized Pascal mapping. The method comprises: step, extracting accurate edge points from a real image by means an edge detection method of an ellipse detection method, connecting edge points into arcs, and taking a de-noised arc set as input of an ellipse detection acceleration method; step, screening out a valid candidate arc combinations probably belonging to the same ellipse from the arc set input in step; step, calculating five parameters of a candidate ellipse; repeating stepto stepuntil all valid candidate arc combinations in the arc set and corresponding candidate ellipses are found; and step, clustering and verifying candidate ellipse sets, obtaining a final detected ellipse set.


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