The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Mar. 16, 2020
Applicant:
Wistron Corporation, New Taipei, TW;
Inventor:
Cheng-Wei Lin, New Taipei, TW;
Assignee:
Wistron Corporation, New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2023.01); G06F 17/16 (2006.01); G06N 3/04 (2023.01); G06F 18/2413 (2023.01); G06F 18/21 (2023.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 17/16 (2013.01); G06F 18/2178 (2023.01); G06F 18/24137 (2023.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
Abstract
A method and device for determining whether an object includes a defect are provided. The method includes the following steps. A tested image of a tested object is obtained. Selected good product sample data corresponding to the tested object is obtained. A dissimilarity value between the tested image and the selected good product sample data is calculated by using a dissimilarity model, and whether the tested object is a good product or a defective product is determined according to the dissimilarity value.