The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Jan. 11, 2023
Dimaag-ai, Inc., Fremont, CA (US);
Rajaram Kudli, Bengaluru, IN;
Satish Padmanabhan, Sunnyvale, CA (US);
Fuk Ho Pius Ng, Portland, OR (US);
Nagarjun Pogakula Surya Prakash, Bangalore, IN;
Ananda Shekappa Sonnada, Bangalore, IN;
DIMAAG-AI, Inc., Fremont, CA (US);
Abstract
A feature data segment may be determined by applying a feature segmentation model to a test data observation. The feature segmentation model may be pre-trained via a plurality of training data observations and may divide the plurality of training data observations into a plurality of feature data segments. A predicted target value may be determined by applying to a test data observation a prediction model pre-trained via a plurality of training data observations. One or more distance metrics representing a respective distance between the test data observation and the feature data segment along one or more dimensions may be determined. The one or more distance metrics may be represented in a user interface. An updated prediction model and an updated feature segmentation model that both incorporate the test data observation and the training data observations may be determined based on user input.