The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Nov. 26, 2019
Applicant:
Omron Corporation, Kyoto, JP;
Inventor:
Yoichi Kurokawa, Kyoto, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0254 (2013.01); G05B 13/0265 (2013.01);
Abstract
The disclosure provides an environment in which it is possible to switch an algorithm involved in an abnormality detection process. A control device: calculates a feature quantity from a state value acquired from a monitored object; uses a learning model on the basis of the calculated feature quantity to execute one of a plurality of types of algorithms for calculating a value indicating the probability that an abnormality is occurring in the monitored object; determines, on the basis of the calculated value, whether the abnormality is occurring; and switches, in accordance with a condition defined in advance, the one algorithm that is executed.