The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Apr. 27, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Misa Nozuki, Tokyo, JP;
Shinsuke Miki, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
An abnormality diagnosis method for diagnosing an abnormality in equipment includes acquiring multivariate time-series data for a plurality of measurement items from the equipment, diagnosing an abnormality in operational state of the equipment based on the multivariate time-series data, and diagnosing a cause of the abnormality. The diagnosing a cause of the abnormality includes extracting a feature of a first section before the occurrence of the abnormality from the multivariate time-series data of the first section, extracting a feature of a second section after the occurrence of the abnormality from the multivariate time-series data of the second section, obtaining an amount of change in feature from a difference between the feature of the first section and the feature of the second section, and diagnosing a measurement item that is the cause of the abnormality based on the amounts of change in features of the plurality of measurement items.