The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Jul. 07, 2021
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Richard P. Sonderegger, Dorchester, MA (US);

Kenneth P. Baclawski, Waltham, MA (US);

Guang C. Wang, San Diego, CA (US);

Anna Chystiakova, Palo Alto, CA (US);

Dieter Gawlick, Palo Alto, CA (US);

Zhen Hua Liu, San Mateo, CA (US);

Kenny C. Gross, Escondido, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/00 (2019.01); G05B 15/02 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 13/0265 (2013.01); G05B 15/02 (2013.01); G06N 20/00 (2019.01); G05B 2223/02 (2018.08);
Abstract

The disclosed embodiments relate to a system that automatically adapts a prognostic-surveillance system to account for aging phenomena in a monitored system. During operation, the prognostic-surveillance system is operated in a surveillance mode, wherein a trained inferential model is used to analyze time-series signals from the monitored system to detect incipient anomalies. During the surveillance mode, the system periodically calculates a reward/cost metric associated with updating the trained inferential model. When the reward/cost metric exceeds a threshold, the system swaps the trained inferential model with an updated inferential model, which is trained to account for aging phenomena in the monitored system.


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