The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Feb. 25, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kouki Oikawa, Yamanashi, JP;

Kenta Yamamoto, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/404 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G05B 19/404 (2013.01); G06N 20/00 (2019.01); G05B 2219/37434 (2013.01); G05B 2219/41115 (2013.01); G05B 2219/41256 (2013.01);
Abstract

A chatter vibration determination device is provided with a machine learning device configured to observe machining condition data including a feed speed and a spindle rotational frequency in cutting as state data representative of the current state of environment, execute processing related to machine learning using a learning model obtained by modeling the relationship of chatter vibration with a machining condition for the cutting, based on the state data, and estimate the occurrence/non-occurrence of chatter vibration and the improvement of the chatter vibration. The chatter vibration determination device outputs the result of the estimation of the occurrence/non-occurrence of the chatter vibration and the improvement of the chatter vibration.


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