The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Jun. 18, 2018
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Takahiko Masuzaki, Tokyo, JP;

Osamu Nasu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G06N 20/00 (2019.01); G01M 99/00 (2011.01); G06Q 10/0639 (2023.01); G06Q 50/04 (2012.01); G07C 3/00 (2006.01);
U.S. Cl.
CPC ...
G05B 13/0265 (2013.01); G01M 99/005 (2013.01); G06N 20/00 (2019.01); G06Q 10/06395 (2013.01); G06Q 50/04 (2013.01); G07C 3/005 (2013.01);
Abstract

A diagnostic device () includes an acquirer () and a diagnoser (). The acquirer () acquires a plurality of input signals including a target signal to be diagnosed for abnormality. The diagnoser () diagnoses, using a first index value relating to the target signal and a second index value relating to the plurality of input signals based on a correlation between the plurality of input signals, whether an abnormality occurs. The first index value indicates a degree of similarity of a waveform of the target signal to a predetermined reference waveform. The second index value is a value that is based on comparison between the target signal and a predetermined pattern and is calculated from values of the plurality of input signals.


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