The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Jun. 28, 2022
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Richard Schroedter, Dresden, AT;

Han Woong Yoo, Vienna, AT;

David Brunner, Dobersberg, AT;

Georg Schitter, Vienna, AT;

Franz Michael Darrer, Graz, AT;

Marcus Edward Hennecke, Graz, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/10 (2006.01); G02B 7/185 (2021.01); G02B 7/182 (2021.01);
U.S. Cl.
CPC ...
G02B 26/0841 (2013.01); G02B 7/185 (2013.01); G02B 7/1821 (2013.01); G02B 26/0858 (2013.01); G02B 26/10 (2013.01);
Abstract

An oscillator system includes an electrostatic oscillator structure configured to oscillate about an axis based on a deflection that varies over time; an actuator configured to drive the electrostatic oscillator structure about the axis, the actuator including a first capacitive element having a first capacitance dependent on the deflection and a second capacitive element having a second capacitance dependent on the deflection; a sensing circuit configured to receive a first displacement current from the first capacitive element and a second displacement current from the second capacitive element, to integrate the first displacement current to generate a first capacitive charge value, and to integrate the second displacement current to generate a second capacitive charge value; and a measurement circuit configured to receive the first and the second capacitive charge values and to measure the deflection of the electrostatic oscillator structure based on the first and the second capacitive charge values.


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