The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Jul. 10, 2020
Applicant:

Georgia Tech Research Corporation, Atlanta, GA (US);

Inventors:

Phillip Neal First, Atlanta, GA (US);

Zhigang Jiang, Atlanta, GA (US);

Thomas Michael Orlando, Atlanta, GA (US);

Elliot Christian Frey, Atlanta, GA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/26 (2006.01); G01T 3/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/26 (2013.01); G01T 3/00 (2013.01);
Abstract

A radiation detector () includes an insulating substrate (), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film () is disposed in relation to a surface of the substrate. The conductive film () has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate () has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.


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