The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Aug. 23, 2021
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Fangning He, Chicago, IL (US);

David Doria, Oak Park, IL (US);

Xin Chen, Evanston, IL (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 17/931 (2020.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4808 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

Methods, apparatuses, and systems are provided for detecting overhead obstructions along a path segment. One exemplary method includes receiving three-dimensional data collected by a depth sensing device traveling along a path segment, wherein the three-dimensional data comprises point cloud data positioned above a ground plane of the path segment. The method further includes identifying data points of the point cloud data positioned within a corridor positioned above the ground plane. The method further includes projecting the identified data points onto a plane. The method further includes detecting the overhead obstruction based on a concentration of point cloud data positioned within a plurality of cells of the plane. The method further includes storing the detected overhead obstruction above the path segment within a map database.


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