The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Mar. 30, 2022
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Mario Zeller, Erlangen, DE;

Adam Kettinger, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/58 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/58 (2013.01); G01R 33/561 (2013.01);
Abstract

To acquire measurement data of an object, a first subsampled set of diffusion-weighted measurement data with switching of diffusion gradients for diffusion encoding of the measurement data, using a first echo spacing, and a second subsampled set of non-diffusion-weighted measurement data, using the first echo spacing, are acquired. The first and second subsampled sets of measurement data are supplemented using calibration data to produce first and second complete sets of measurement data. At least the first calibration data, acquired using the first echo spacing, may be used for supplementing the second subsampled set of measurement data to produce a second complete set of measurement data. By supplementing subsampled sets of measurement data with calibration data acquired according to the same echo spacing as the subsampled measurement data, noise signals in the supplemented measurement data are advantageously eliminated.


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