The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Jan. 25, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Corbett Rowell, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); H01Q 19/19 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/0878 (2013.01); H01Q 19/192 (2013.01);
Abstract

An over-the-air (OTA) measurement system for testing a device under test, with a plurality of feed antennas, a test location for the device under test, and a reflector array with a main reflector and a sub-reflector. The plurality of feed antennas face the sub-reflector. The reflector array is located such that a signal path is established between the plurality of feed antennas and the test location via the sub-reflector and the main reflector. The sub-reflector has at least one focal point. The plurality of feed antennas include a first feed antenna and at least one second feed antenna. The first feed antenna is associated with the focal point of the sub-reflector. The at least one second feed antenna is located offset from the focal point of the sub-reflector. Further, a method of testing a device under test over-the-air is described.


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