The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Jul. 03, 2018
The Regents of the University of California, Oakland, CA (US);
Pei-Yu E. Chiou, Los Angeles, CA (US);
Michael A. Teitell, Tarzana, CA (US);
Xiongfeng Zhu, Los Angeles, CA (US);
Xing Haw Marvin Tan, Jurong West, SG;
Thang Nguyen, Fountain Valley, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
New platform technologies to actuate and sense force propagation in real-time for large sheets of cells are provided. In certain embodiments the platform comprises a device for the measurement of mechanical properties of cells or other moieties, where device comprises a transparent elastic or viscoelastic polymer substrate disposed on a rigid transparent surface; and a plurality of micromirrors disposed on or in said polymer substrate, wherein the reflective surfaces of the micromirrors are oriented substantially parallel to the surface of said polymer substrate. In certain embodiments the device comprises more than about 1,000,000, or more than about 10,000,000 micromirrors. In certain embodiments the micromirrors comprise a magnetic layer and/or a diffraction grating.