The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Feb. 14, 2022
Applicants:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Shinya Takeshita, Toyota, JP;

Toshiyuki Takahara, Gotemba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/18 (2018.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01B 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/18 (2013.01); G01B 15/025 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/04 (2013.01); G01N 2223/401 (2013.01); G01N 2223/652 (2013.01);
Abstract

An inspection method of a membrane electrode assembly includes a first process of acquiring an X-ray transmission image of the membrane electrode assembly, a second process of identifying a luminance-reduced region having a luminance lower than a luminance of a surrounding region in the X-ray transmission image acquired in the first process, a third process of correcting the luminance of the luminance-reduced region identified in the second process, in accordance with a planar size of the luminance-reduced region, based on a correlation between a planar size of a foreign matter in the membrane electrode assembly and change in luminance due to diffraction of X-rays, and a fourth process of finding a thickness of the foreign matter in the membrane electrode assembly based on the luminance corrected in the third process.


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