The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Mar. 29, 2022
Applicant:

Yokogawa Electric Corporation, Musashino, JP;

Inventor:

Syuhei Okada, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 21/88 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01J 3/28 (2013.01); G01N 21/17 (2013.01); G01J 2003/2859 (2013.01); G01N 2021/1738 (2013.01);
Abstract

A measurement apparatus () includes a generator () that irradiates electromagnetic waves on a measurement target (M) including a substance that undergoes a structural transition from a first substance with an unstable structure to a second substance with a stable structure due to entry of a foreign substance, a receiver () that receives the electromagnetic waves including information on a spectroscopic spectrum of the measurement target (M), and a controller () that acquires the measured spectroscopic spectrum based on the electromagnetic waves received by the receiver (), calculates ratio information between the first substance and the second substance based on the acquired measured spectroscopic spectrum, and generates diagnostic information regarding entry of the foreign substance based on the ratio information.


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