The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Mar. 26, 2020
Applicant:

Sysmex Corporation, Kobe, JP;

Inventor:

Momoko Imakubo, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 21/64 (2006.01); G01N 15/14 (2006.01); G06V 20/20 (2022.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 15/1475 (2013.01); G06V 20/20 (2022.01); G06V 20/693 (2022.01); G01N 2015/1486 (2013.01);
Abstract

Disclosed is a fluorescence image analyzer for analyzing a fluorescence image of a cell contained in a sample. The fluorescence image analyzer includes a light source configured to apply light to the sample; an imaging unit configured to capture a fluorescence image of the cell by which fluorescence is generated by applying the light; and a processing unit configured to process the captured fluorescence image. The processing unit is programmed to obtain a bright point pattern of fluorescence in the captured fluorescence image; select at least one bright point pattern, from among a plurality of bright point patterns that include one or more positive patterns and are associated with at least one of a measurement item or a labeling reagent; and determine what positive pattern, among the selected at least one bright point pattern, corresponds to the obtained bright point pattern, based on the obtained bright point pattern and the selected at least one bright point pattern.


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