The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Mar. 04, 2022
Applicant:

Sivananthan Laboratories, Inc., Bolingbrook, IL (US);

Inventors:

Nigel Browning, Formby, GB;

Christopher Frank Buurma, Columbus, OH (US);

Assignee:

Sivananthan Laboratories, Inc., Bolingbrook, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/22 (2006.01); H04N 5/33 (2006.01); G01J 5/20 (2006.01);
U.S. Cl.
CPC ...
G01J 5/22 (2013.01); H04N 5/33 (2013.01); G01J 2005/202 (2013.01);
Abstract

An imaging system includes a focal plane array, readout electronics, and a computing system in which the number of active pixels is either set at a low-fraction of the total pixels thereby reducing the effect of radiation damage, or radiation damage over time is detected and automatically compensated. Machine learning is used to identify radiation damaged pixels and damaged regions which are subsequently eliminated and replaced by the computational system. The machine learning is used to identify changes in the fixed pattern signal/noise and/or noise of the system, and is then computationally corrected.


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