The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2023

Filed:

Feb. 26, 2021
Applicant:

Lyle G. Shirley, Boxborough, MA (US);

Inventor:

Lyle G. Shirley, Boxborough, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02004 (2022.01); A61B 5/117 (2016.01); G06F 21/32 (2013.01); G06T 7/55 (2017.01); G01B 9/02055 (2022.01); G01B 9/02 (2022.01); G01B 11/24 (2006.01); G01B 9/02002 (2022.01); G06T 7/521 (2017.01); G01B 11/14 (2006.01); G06V 10/143 (2022.01); G06F 18/25 (2023.01); G06V 10/80 (2022.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02004 (2013.01); A61B 5/117 (2013.01); G01B 9/02005 (2013.01); G01B 9/02069 (2013.01); G01B 9/02083 (2013.01); G01B 9/02094 (2013.01); G01B 9/02096 (2013.01); G01B 11/14 (2013.01); G01B 11/2441 (2013.01); G06F 18/253 (2023.01); G06F 21/32 (2013.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); G06V 10/143 (2022.01); G06V 10/806 (2022.01); A61B 5/0077 (2013.01); A61B 2576/00 (2013.01); G06T 2207/10152 (2013.01);
Abstract

Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.


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