The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Jan. 17, 2020
Oculus Optikgeraete Gmbh, Wetzlar, DE;
Andreas Steinmueller, Wettenberg, DE;
OCULUS OPTIKGERAETE GMBH, Wetzler, DE;
Abstract
A method for testing the eyes of a test person with the aid of a vision testing system as well as vision testing system, comprising a first measuring device, a second topographic measuring device, a third refractive measuring device and a processing means, an axial length (L) of an eye of the test person being measured with the aid of the first measuring device, a curvature of the cornea of the eye being measured with the aid of the second measuring device, a refractive property of the eye being measured with the aid of the third measuring device, a measurement simultaneously being carried out with the first, second and third measuring device at the eye, measurement data of the measurements of the first, second and third measuring device being processed with the aid of the processing means, said processing means presenting a database with normal data, a comparison of the measurement data with the normal data being carried out and a result of said comparison being issued by means of said processing means.