The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2023
Filed:
Sep. 28, 2022
Acucela Inc., Seattle, WA (US);
Ryo Kubota, Seattle, WA (US);
Philip M. Buscemi, Mount Pleasant, SC (US);
Matthias Pfister, Liebefeld-Bern, CH;
Stephan Wyder, Bern, CH;
Amitava Gupta, Roanoke, VA (US);
ACUCELA INC., Seattle, WA (US);
Abstract
An OCT axial length measurement device is configured to measure an area of the retina within a range from about 0.05 mm to about 2.0 mm. The area can be measured with a scanned measurement beam or plurality of substantially fixed measurement beams. The OCT measurement device may comprise a plurality of reference optical path lengths, in which a first optical path length corresponds to a first position of a cornea, and a second optical path length corresponds to a second position of the retina, in which the axial length is determined based on a difference between the first position and the second position. An axial length map can be generated to determine alignment of the eye with the measurement device and improve accuracy and repeatability of the measurements. In some embodiments, the OCT measurement device comprises a swept source vertical cavity surface emitting laser ('VCSEL').